Introduction:
After decades of advancement, the electron microscope has become an indispensable tool in modern scientific research. Ultrathin sectioning technology is an essential step in electron microscopy sample preparation. In recent years, with technological progress, ultrathin sectioning has evolved—from room temperature to cryogenic conditions, and from two-dimensional to three-dimensional imaging.
This
workshop focuses on introducing the complete workflow of SEM 3D ultrathin
section reconstruction, including sample preparation, section collection, and
SEM imaging reconstruction.
We welcome all faculty members and students to attend this section collection system
workshop. If you have any questions, please contact Ms. He at extension #5065.
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【Workshop Schedule】:
◆3D
Sample Preparation and SYM Cuesta Section Collection System (Oral Presentation)
:
Date: Wednesday, December 17, 2025
Time: 10:00 AM – 11:00 PM
Venue: 4th Floor, Area B, Room 0459, Microscopy Center, First Medical Building, Chang Gung University
Speaker: Mr. Shao-Hsuan Lin,
Instrument Specialist, Minerva Technology
◆Next-Generation
Biological Scanning Electron Microscopy: Volume EM and Correlative Microscopy
(Oral Presentation):
Date: Wednesday, December 17, 2025
Time: 11:00 AM – 12:00 PM
Venue: 4th Floor, Area B, Room
0459, Microscopy Center, First Medical
Speaker: Mr. Kang-You Fan, Application Engineer, Carl Zeiss
◆Hands-on Practice:
Date: Wednesday, December 17, 2025
Time: 14:00 PM – 17:00 PM
Venue: 4th Floor, Area B, Room 0459, Microscopy Center, First Medical Building, Chang Gung University
Speaker: Mr. Shao-Hsuan Lin, Instrument Specialist, Minerva Technology
※Notice
Due to limited space, early registration is recommended.It is suggested that each laboratory send at least one representative to participate.
Registration Link:
https://forms.gle/iLweuu9SZ28uz6zA8※Kindly respond before December 16 (Tuesday). Thank you for your cooperation.
